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  • Session 1: Plenary I
  • 2016 CS MANTECH Conference

    Session 1: Plenary I

    Session 2: Plenary II

    Session 3: RF GaN Devices

    Session 4: III-V Devices

    Session 5a: Test & Characterization

    Session 5b: Materials & Epi

    Session 6a: Process: III-V Technology

    Session 6b: Manufacturing - Data & Automation

    Session 7a: Thermal Management

    Session 7b: Manufacturing - Defects & Quality

    Session 8a: Heterogeneous Integration

    Session 8b: Power Electronics

    Rump Sessions

    Session 9: Process - GaN

    Session 10a: Process - Metallization

    Session 10b: Reliability

    Session 11: Process - Passivation

    Session 12: Posters - Optoelectronics & Emerging Wide Bandgap Devices

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    •   Session 1: Plenary I
    •   Session 2: Plenary II
    •   Session 3: RF GaN Devices
    •   Session 4: III-V Devices
    •   Session 5a: Test & Characterization
    •   Session 5b: Materials & Epi
    •   Session 6a: Process: III-V Technology
    •   Session 6b: Manufacturing - Data & Automation
    •   Session 7a: Thermal Management
    •   Session 7b: Manufacturing - Defects & Quality
    •   Session 8a: Heterogeneous Integration
    •   Session 8b: Power Electronics
    •   Rump Sessions
    •   Session 9: Process - GaN
    •   Session 10a: Process - Metallization
    •   Session 10b: Reliability
    •   Session 11: Process - Passivation
    •   Session 12: Posters - Optoelectronics & Emerging Wide Bandgap Devices
    • Show All